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Speaker: Jerzy T. Sadowski, Brookhaven National Laboratory

Title: Electron Spectro-Microscopy of 2D Materials and Devices

Abstract: The ongoing miniaturization in technological devices and the progress in surface science demand novel instrumental methods for surface characterization on a length scale of only a few atomic distances. The combination of a low-energy electron microscope (LEEM) and X-ray photoelectron emission microscope (XPEEM) is a powerful technique for studying the dynamic and static properties of 2D materials surfaces and thin films, including growth and decay, phase transitions, reactions, surface structure and local chemistry. It utilizes low energy electrons to image surfaces with few nm lateral resolution and atomic layer depth resolution. In the LEEM/XPEEM setup, when using the electron irradiation, the backscattered electrons, Auger and secondary electrons may be used, while photoelectrons, Auger and secondary electrons are utilized for imaging when sample is irradiated with X-rays. In this talk I will present examples of the application of the LEEM/XPEEM technique to the investigations of novel materials, including 2D layered materials and devices, thin films, and adsorbate structures. This research used resources of the Center for Functional Nanomaterials and the National Synchrotron Light Source II, which are U.S. Department of Energy (DOE) Office of Science facilities at Brookhaven National Laboratory, under Contract No. DE-SC0012704. LEEM/XPEEM – a tool for comprehensive characterization of structural, chemical, electronic and magnetic properties of 2D materials and surfaces at nanoscale.

Bio: Dr. Jurek (Jerzy) Sadowski is a Senior Scientist in the Center for Functional Nanomaterials (CFN) at Brookhaven National Laboratory. He received his PhD from Institute of Electron Technology in Warsaw, Poland in 1999. After receiving his degree, Dr. Sadowski joined Surface Science group at the Institute for Materials Research at Tohoku University, in Sendai, Japan, initially as a post-doc and later as a faculty member, where he worked on the elucidation of the growth mechanisms in organic thin films. Since 2008 Dr. Sadowski is a staff scientist in the Interface Science and Catalysis Group at the CFN, coordinating the low-energy electron microscopy / x-ray photoemission electron microscopy (LEEM/XPEEM) research program at Brookhaven National Laboratory. His research interests encompass applications of electron spectro-microscopic techniques to investigation of structural, electronic, magnetic and chemical properties of 2D materials and surfaces at nanoscale.